- Designed for electronics engineers, manufacturers, and professionals seeking a reliable solution for testing and programming semiconductor devices. - Features stable performance with TO3P TO247 5L aging test sockets, gold-plated for enhanced antioxidant properties, ensuring long-lasting functionality of electronic components. - Capable of withstanding high temperatures, this mounting socket supports a current carrying capacity of 10 A, making it suitable for low-power devices. - Ideal for mass production lines or electronic device repair centers, this aging test and burn socket is specifically tailored for efficient testing of TO3P and TO247-5L components. - Use scenarios include: - Testing semiconductor devices in production environments to ensure quality and reliability. - Performing maintenance and repairs on electronic devices in service centers, facilitating quick diagnostics and repairs. - Compatible with various semiconductor components, this socket is a crucial tool for ensuring optimal performance and longevity in electronic applications.